The Most Comprehensive Patent Search Software Tool

LexisNexis TotalPatent One® is the ultimate patent search software that provides results that you can rely on.

Use LexisNexis TotalPatent One® patent search software for comprehensive research and analytics. Search issued patents, published patent applications, and utility models, globally. Identify IP documentation and bring insights to your work.

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内容全面

全球规模最大、最深入的专利数据集合。
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快速高效

更快捷、更高效的用户体验,无需等待页面加载。

直观易用

简单的用户界面可帮助您轻松发现所需的专利检索结果。
Peace of Mind for Your Patent Search
Patent research and analysis can seem daunting — we make it easy. From novice to expert, improve your patent search experience with our extensive database and educational aides.

客户支持和培训

从入职培训到每周一次的现场培训网络研讨会,囊括所有形式和内容

全面完整的专利数据库

来自全球专利局

借助直观的用户界面提高操作速度

A patent search software tool that is easy to use and learn

创新技术

全新的先进检索技术和用户界面

130 Million Documents

108 Million Full-Text Documents

67 Full-Text Authorities

专利研究:回顾与展望
A Thorough Patent Search Tool
View a sneak peek of the search possibilities of our TotalPatent One® software. Customize your patent investigation to meet your needs with our various search views.

针对性的检索结果

Search over 100 worldwide patent authorities simultaneously through a single patent search platform to ensure that no stone goes unturned and to ensure maximum efficiency.

网格视图

Easily scan through patent images to find exactly what you need. Grid View focuses primarily on presenting a patent document’s title and drawings to help patent searchers visually assess which search results are pertinent or irrelevant.

专利可视化工具

借助全新无限下拉技术,您可节省时间,还可毫无限制地进行专利研究以及对完整检索结果进行统一筛选。
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Learn more about the benefits you can receive by using our patent search software
Patent Search Resources
How USPTO Examiner Type Affects Patents

How USPTO Examiner Type Affects Patents

By Michael Sartori & Matt WelchOriginally published on Law360.comMichael Sartori, a partner, and Matt Welch, an associate at Baker Botts, LLP used data from LexisNexis PatentAdvisor® to complete an analysis on ten years of examiner data from the eight non-design...